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PDF CD4008BMS Data sheet ( Hoja de datos )

Número de pieza CD4008BMS
Descripción CMOS 4-Bit Full Adder With Parallel Carry Out
Fabricantes Intersil Corporation 
Logotipo Intersil Corporation Logotipo



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No Preview Available ! CD4008BMS Hoja de datos, Descripción, Manual

CD4008BMS
November 1994
CMOS 4-Bit Full Adder With
Parallel Carry Out
Features
Pinout
• High-Voltage Type (20V Rating)
• 4 Sum Outputs Plus Parallel Look-ahead Carry-Output
CD4008BMS
TOP VIEW
• High-Speed Operation - Sum In-To-Sum Out, 160ns
Typ; Carry In-To-Carry Out, 5ns Typ. At VDD = 10V,
CL=50pF
• Standardized Symmetrical Output Characteristics
• 100% Tested For Quiescent Current At 20V
• Maximum Input Current of 1µa at 18V Over Full Pack-
age-Temperature Range;
- 100nA at 18V and 25oC
• Noise Margin (Over Full Package Temperature Range):
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• 5V, 10V and 15V Parametric Ratings
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• Binary Addition/Arithmetic Units
A4 1
B3 2
A3 3
B2 4
A2 5
B1 6
A1 7
VSS 8
16 VDD
15 B4
14 CO
13 S4
12 S3
11 S2
10 S1
9 C1
Logic Diagram
HIGH SPEED
PAR CARRY
* 15
B4
A4 * 1
B3 * 2
A3 * 3
14
CO
(CARRY-OUT)
SUM
C4
SUM
13
S4
12 S3
Description
CD4008BMS types consist of four full adder stages with fast
look ahead carry provision from stage to stage. Circuitry is
included to provide a fast “parallel-carry-out” but to permit
high-speed operation in arithmetic sections using several
CD4008BMS’s.
CD4008BMS inputs include the four sets of bits to be added,
A1 to A4 and B1 to B4, in addition to the “Carry In” bit from a
previous section. CD4008BMS outputs include the four sum
bits, S1 to S4. In addition to the high speed “parallel-carry-
out” which may be utilized at a succeeding CD4008BMS
section.
The CD4008BMS is supplied in these 16-lead outline pack-
ages:
B2 * 4
A2 * 5
B1 * 6
A1 * 7
C1 * 9
(CARRY-IN)
VDD = 16
VSS = 8
C3
SUM
11
S2
C2
SUM
10
S1
VDD
*ALL INPUTS ARE PROTECTED
BY CMOS PROTECTION
NETWORK
VSS
TRUTH TABLE
Ai Bi Ci CO SUM
Braze Seal DIP H4T
Frit Seal DIP
H1F
Ceramic Flatpack H6W
00000
10001
01001
11010
00101
10110
01110
11111
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-675
File Number 3292

1 page




CD4008BMS pdf
Specifications CD4008BMS
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Propagation Delay Time
SYMBOL
CONDITIONS
TPHL VDD = 5V
TPLH
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 2, 3, 4
TEMPERATURE
+25oC
MIN
-
3. See Table 2 for +25oC limit.
4. Read and Record
MAX
1.35 x
+25oC
Limit
UNITS
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25OC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
IDD
IOL5
IOH5A
± 1.0µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9 Table 4
FUNCTION
Static Burn-In 1
Note 1
Static Burn-In 2
Note 1
Dynamic Burn-
In Note 1
Irradiation
Note 2
OPEN
10 - 14
10 - 14
-
10 - 14
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
1 - 9, 15
16
8 1 - 7, 9, 15, 16
8
16
10 - 14
2, 4, 6, 15
1, 3, 5, 7, 9
8 1 - 7, 9, 15, 16
7-679

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