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Número de pieza | CD40175BMS | |
Descripción | CMOS Quad D Type Flip-Flop | |
Fabricantes | Intersil Corporation | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de CD40175BMS (archivo pdf) en la parte inferior de esta página. Total 8 Páginas | ||
No Preview Available ! CD40175BMS
December 1992
CMOS Quad ‘D’ Type Flip-Flop
Features
Pinout
• High Voltage Type (20V Rating)
• Output Compatible with Two HTL Loads, Two Low Power
TTL Loads, or One Low Power Schottky TTL Load
• Functional Equivalent to TTL74175
• 100% Tested for Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Maximum Input Current of 1µA at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package/Temperature Range)
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
CD40175BMS
TOP VIEW
CLEAR 1
Q1 2
Q1 3
D1 4
D2 5
Q2 6
Q2 7
VSS 8
VDD = PIN 16
VSS = PIN 8
16 VDD
15 Q4
14 Q4
13 D4
12 D3
11 Q3
10 Q3
9 CLOCK
• Standardized Symmetrical Output Characteristics
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Functional Diagram
Applications
• Shift Registers
• Buffer/Storage Registers
• Pattern Generators
Description
CD40175BMS consists of four identical D-type flip-flops.
Each flip-flop has an independent DATA D input and comple-
mentary Q and Q outputs. The CLOCK and CLEAR inputs
are common to all flip-flops. Data are transferred to the Q
outputs on the positive going transition of the clock pulse. All
four flip-flops are simultaneously reset by a low level on the
CLEAR input.
These devices can function as shift register elements or as
T-type flip-flops for toggle and counter applications.
The CD40175BMS is supplied in these 16-lead outline
packages:
Braze Seal DIP
H4T
Ceramic Flatpack H6W
4
D1
5
D2
12
D3
13
D4
CLOCK 9
1
CLEAR
F/F1
F/F2
2 Q1
3
Q1
7
Q2
6
Q2
F/F3
10 Q3
11
Q3
F/F4
15 Q4
14
Q4
VSS = 8
VDD = 16
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-1392
File Number 3360
1 page Specifications CD40175BMS
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
Propagation Delay Time
SYMBOL
CONDITIONS
IDD VDD = 20V, VIN = VDD or GND
VNTH VDD = 10V, ISS = -10µA
∆VTN VDD = 10V, ISS = -10µA
VTP
∆VTP
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
F
TPHL
TPLH
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
VDD = 5V
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE
+25oC
+25oC
+25oC
MIN
-
-2.8
-
1, 4
+25oC
0.2
1, 4
+25oC
-
1
1, 2, 3, 4
+25oC
+25oC
VOH >
VDD/2
-
3. See Table 2 for +25oC limit.
4. Read and Record
MAX
7.5
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25oC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-1
Output Current (Sink)
Output Current (Source)
IDD
IOL5
IOH5A
± 0.2µA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A, RONDEL10
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9 Table 4
7-1396
5 Page |
Páginas | Total 8 Páginas | |
PDF Descargar | [ Datasheet CD40175BMS.PDF ] |
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