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Número de pieza | CD4023BC | |
Descripción | Buffered Triple 3-Input NAND Gate | |
Fabricantes | Fairchild Semiconductor | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de CD4023BC (archivo pdf) en la parte inferior de esta página. Total 6 Páginas | ||
No Preview Available ! October 1987
Revised August 2000
CD4023BC
Buffered Triple 3-Input NAND Gate
General Description
These triple gates are monolithic complementary MOS
(CMOS) integrated circuits constructed with N- and P-
channel enhancement mode transistors. They have equal
source and sink current capabilities and conform to stan-
dard B series output drive. The devices also have buffered
outputs which improve transfer characteristics by providing
very high gain. All inputs are protected against static dis-
charge with diodes to VDD and VSS.
Features
s Wide supply voltage range: 3.0V to 15V
s High noise immunity: 0.45 VDD (typ)
s Low power TTL compatibility:
fan out of 2 driving 74L or 1 driving 74LS
s 5V–10V–15V parametric ratings
s Symmetrical output characteristics
s Maximum input leakage 1 µA at 15V over full
temperature range
Ordering Code:
Order Number Package Number
Package Description
CD4023BCM
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
CD4023BCS
M14D
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
CD4023BCN
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” tot he ordering code.
Connection Diagram
Block Diagram
Top View
1/3 Device Shown
*All Inputs Protected by Standard CMOS Input Protection Circuit.
© 2000 Fairchild Semiconductor Corporation DS005956
www.fairchildsemi.com
1 page Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
5 www.fairchildsemi.com
5 Page |
Páginas | Total 6 Páginas | |
PDF Descargar | [ Datasheet CD4023BC.PDF ] |
Número de pieza | Descripción | Fabricantes |
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