CD40257BMS Datasheet PDF - Intersil Corporation
| Part Number | CD40257BMS | |
| Description | CMOS Quad 2 Line to 1 Line Data Selector/Multiplexer | |
| Manufacturers | Intersil Corporation | |
| Logo |  |
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CD40257BMS
December 1992
CMOS Quad 2 Line to 1 Line
Data Selector/Multiplexer
Features
Pinout
• High Voltage Type (20V Rating)
• 3-State Outputs
CD40257BMS
TOP VIEW
• 100% Tested for Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Maximum Input Current of 1µA at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package/Temperature Range)
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Standardized Symmetrical Output Characteristics
INPUT SELECT 1
A1 2
B1 3
D1 4
A2 5
B2 6
D2 7
VSS 8
16 VDD
15 OUTPUT DISABLE
14 A4
13 B4
12 D4
11 A3
10 B3
9 D3
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• Digital Multiplexing
• Shift Right/Shift Left Registers
• True/Complement Selection
Description
CD40257BMS is a data selector/multiplexer featuring three
state outputs which can interface directly with and drive data
lines of bus oriented systems.
The CD40257BMS is supplied in these 16-lead outline
packages:
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
H4T
H1E
H3X
Functional Diagram
2
A1
3
B1
5
A2
6
B2
11
A3
10
B3
14
A4
13
B4
OUTPUT
DISABLE
15
1
INPUT
SELECT
4
D1
7
D2
9
D3
12
D4
VDD = 16
VSS = 8
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
7-1442
File Number 3364
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Specifications CD40257BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1
(Note 1)
4, 7, 9, 12
1-3, 5, 6, 8, 10, 11,
13-15
16
Static Burn-In 2
(Note 1)
4, 7, 9, 12
8, 15
1-3, 5, 6, 10, 11,
13, 14, 16
Dynamic Burn-
In (Note 1)
-
8, 15
16
4, 7, 9, 12
2, 3, 5, 6, 10, 11,
1
13, 14
Irradiation
(Note 2)
4, 7, 9, 12
8 1-3, 5, 6, 10, 11,
13-16
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
7-1446
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| Information | Total 8 Pages | |
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