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What is CD4510BMS?

This electronic component, produced by the manufacturer "Intersil Corporation", performs the same function as "CMOS Presettable Up/Down Counters".


CD4510BMS Datasheet PDF - Intersil Corporation

Part Number CD4510BMS
Description CMOS Presettable Up/Down Counters
Manufacturers Intersil Corporation 
Logo Intersil Corporation Logo 


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Data Sheet
CD4510BMS, CD4516BMS
December 1992
File Number 3338
CMOS Presettable Up/Down Counters
CD4510BMS Presettable BCD Up/Down Counter and the
CD4516BMS Presettable Binary Up/Down counter consist of
four synchronously clocked D-type flip-flops (with a gating
structure to provide T-type flip-flop capability) connected as
counters. These counters can be cleared by a high level on
the RESET line, and can be preset to any binary number
present on the jam inputs by a high level on the PRESET
ENABLE line. The CD4510BMS will count out of non-BCD
counter states in a maximum of two clock pulses in the up
mode, and a maximum of four clock pulses in the down mode.
If the CARRY IN input is held low, the counter advances up or
down on each positive-going clock transition. Synchronous
cascading is accomplished by connecting all clock inputs in
parallel and connecting the CARRY OUT of a less significant
stage to the CARRY IN of a more significant stage.
The CD4510BMS and CD4516BMS can be cascaded in the
ripple mode by connecting the CARRY OUT to the clock of
the next stage. If the UP/DOWN input changes during a ter-
minal count, the CARRY OUT must be gated with the clock,
and the UP/DOWN input must change while the clock is
high. This method provides a clean clock signal to the sub-
sequent counting stage. (See Figures 13, 14.)
These devices are similar to types MC14510 and MC14516.
The CD4510BMS and CD4516BMS are supplied in these
16-lead outline packages:
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
*CD4510B Only
*H4W †H45
*FBF †H1F
H6W
†CD4516B Only
Pinout
CD4510BMS, CD4516BMS
TOP VIEW
PRESET ENABLE 1
Q4 2
P4 3
P1 4
CARRY IN 5
Q1 6
CARRY OUT 7
VSS 8
16 VDD
15 CLOCK
14 Q3
13 P3
12 P2
11 Q2
10 UP/DOWN
9 RESET
Features
• High Voltage Types (20V Rating)
• CD4510BMS - BCD Type
• CD4516BMS - Binary Type
• Medium Speed Operation
- fCL = 8MHz Typ. at 10V
• Synchronous Internal Carry Propagation
• Reset and Preset Capability
• 100% Tested for Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Standardized Symmetrical Output Characteristics
• Maximum Input Current of 1µA at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25oC
• Noise Margin (Over Full Package/Temperature Range)
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• Up/Down Difference Counting
• Multistage Synchronous Counting
• Multistage Ripple Counting
• Synchronous Frequency Dividers
Functional Diagram
PRESET ENABLE
4
P1
12
P2
13
P3
3
P4
1
6
Q1
11
Q2
14
Q3
2
Q4
CLOCK
UP/DOWN
CARRY IN
15
10
5
RESET
7
CARRY OUT
9 VDD = 16
VSS = 8
1 CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999

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CD4510BMS equivalent
CD4510BMS, CD4516BMS
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
Propagation Delay Time
SYMBOL
CONDITIONS
IDD VDD = 20V, VIN = VDD or GND
VNTH VDD = 10V, ISS = -10µA
VTN VDD = 10V, ISS = -10µA
VTP
VTP
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
F
TPHL
TPLH
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
VDD = 5V
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE
+25oC
+25oC
+25oC
MIN
-
-2.8
-
MAX
25
-0.2
±1
1, 4
+25oC
0.2 2.8
1, 4
+25oC
- ±1
1
1, 2, 3, 4
+25oC
+25oC
3. See Table 2 for +25oC limit.
4. Read and Record
VOH > VOL <
VDD/2 VDD/2
- 1.35 x
+25oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25oC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
IDD ± 1.0µA
Output Current (Sink)
Output Current (Source)
IOL5
IOH5A
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9 Table 4
5


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