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PDF HCTS164MS Data sheet ( Hoja de datos )
| Número de pieza | HCTS164MS | |
| Descripción | 8-Bit Serial-In/Parallel-Out Shift Register | |
| Fabricantes | Intersil | |
| Logotipo |  |
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TM HCTS164MS
August 1995
Radiation Hardened
8-Bit Serial-In/Parallel-Out Shift Register
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• Dose Rate Survivability >1012 RAD (Si)/s (20ns Pulse)
• Dose Rate Upset >1010 RAD (Si)/s (20ns Pulse)
• Single Event Ray Upset Rate < 2 x 10-9 Errors/Bit Day
(Typ)
• LET Threshold >100 MEV-cm2/mg
• Latch-Up-Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
-VIL = 0.8 VCC (Max)
-VIH = VCC/2 (Min)
• Input Current Levels Ii ≤5µA at VOL, VOH
Description
The Intersil HCTS164MS is a radiation hardened 8-bit Serial-In/
Parallel-Out Shift Register with asynchronous reset.
The HCTS164MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of the
radiation hardened, high-speed, CMOS/SOS Logic Family.
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835, CDIP2-T14
TOP VIEW
DS1 1
DS2 2
Q0 3
Q1 4
Q2 5
Q3 6
GND 7
14 VCC
13 Q7
12 Q6
11 Q5
10 Q4
9 MR
8 CP
14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835, CDFP3-F14
TOP VIEW
DS1
DS2
Q0
Q1
Q2
Q3
GND
1 14
2 13
3 12
4 11
5 10
69
78
VCC
Q7
Q6
Q5
Q4
MR
CP
Ordering Information
PART NUMBER
HCTS164DMSR
HCTS164KMSR
HCTS164D/Sample
HCTS164K/Sample
HCTS164HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
14 Lead SBDIP
14 Lead Ceramic Flatpack
14 Lead SBDIP
14 Lead Ceramic Flatpack
Die
Truth Table
OPERATING
MODE
MR
INPUTS
CP DS1†
DS2†
OUTPUTS
Q0 Q1-Q7
Reset (Clear)
L
X
X
X
L L-L
Shift
H
L L L q0 -q6
H L H L q0 - q6
H H L L q0 - q6
H H H H q0 - q6
H = High Voltage Level
L = Low Voltage Level
= LOW-to-HIGH clock transition
q = Lower case letters indicate the state of the referenced input (or output) one setup time prior to the LOW-to-HIGH clock transition
† = DS1 and DS2 inputs must be at state one setup prior to CP (rising edge)
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
1
FN 3386.1
Spec Number 518613
1 page  
Specifications HCTS164MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETERS
CP to Qn
CP to Qn
MR to Qn
SYMBOL
(NOTES 1, 2)
CONDITIONS
TPLH VCC = 4.5V
TPHL VCC = 4.5V
TPHL VCC = 4.5V
TEMP
+25oC
+25oC
+25oC
200K RAD
LIMITS
MIN MAX
2 33
2 40
2 42
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”.
UNITS
ns
ns
ns
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC 5 12µA
IOL/IOH
5 -15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
Interim Test 1 (Postburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
Interim Test 2 (Postburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
PDA
100% /5004
1, 7, 9, Deltas
Interim Test 3 (Postburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
PDA
100% /5004
1, 7, 9, Deltas
Final Test
100% /5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A Testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
PRE RAD
TEST
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE:
1. Except FN Test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9 Table 4 (Note 1)
Spec Number 518613
5
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