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74ABT5074DB PDF даташит

Спецификация 74ABT5074DB изготовлена ​​​​«NXP Semiconductors» и имеет функцию, называемую «Synchronizing dual D-type flip-flop with metastable immune characteristics».

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Номер произв 74ABT5074DB
Описание Synchronizing dual D-type flip-flop with metastable immune characteristics
Производители NXP Semiconductors
логотип NXP Semiconductors логотип 

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74ABT5074DB Даташит, Описание, Даташиты
Philips Semiconductors Advanced BiCMOS Products
Synchronizing dual D-type flip-flop
with metastable immune characteristics
Product specification
74ABT5074
FEATURES
Metastable immune characteristics
Pin compatible with 74F74 and 74F5074
Typical fMAX = 200MHz
Output skew guaranteed less than 2.0ns
High source current (IOH = 15mA) ideal for clock driver
applications
Output capability: +20mA/–15mA
Latch-up protection exceeds 500mA per Jedec JC40.2 Std 17
ESD protection exceeds 2000V per MIL STD 883 Method 3015
and 200V per Machine Model
DESCRIPTION
The 74ABT5074 is a dual positive edge-triggered D-type flip-flop
featuring individual data, clock, set and reset inputs; also true and
complementary outputs.
Set (SDn) and reset (RDn) are asynchronous active low inputs and
operate independently of the clock (CPn) input. Data must be stable
just one setup time prior to the low-to-high transition of the clock for
guaranteed propagation delays.
Clock triggering occurs at a voltage level and is not directly related
to the transition time of the positive-going pulse. Following the hold
time interval, data at the Dn input may be changed without affecting
the levels of the output.
The 74ABT5074 is designed so that the outputs can never display a
metastable state due to setup and hold time violations. If setup time
and hold time are violated the propagation delays may be extended
beyond the specifications but the outputs will not glitch or display a
metastable state. Typical metastability parameters for the
74ABT5074 are:
τ ≅ 94ps and To 1.3 × 107 sec
where τ represents a function of the rate at which a latch in a
metastable state resolves that condition and T0 represents a
function of the measurement of the propensity of a latch to enter a
metastable state.
PIN CONFIGURATION
RD0 1
D0 2
CP0 3
SD0 4
Q0 5
Q0 6
GND 7
14 VCC
13 RD1
12 D1
11 CP1
10 SD1
9 Q1
8 Q1
SA00001
PIN DESCRIPTION
PIN NUMBER SYMBOL
NAME AND FUNCTION
2, 12
D0, D1 Data inputs
3, 11
CP0, CP1 Clock inputs (active rising edge)
4, 10
SD0, SD1 Set inputs (active-Low)
1, 13
RD0, RD1 Reset inputs (active-Low)
5, 9
Q0, Q1
Data outputs (active-Low),
non-inverting
6, 8
Q0, Q1
Data outputs (active-Low),
inverting
7 GND Ground (0V)
14 VCC Positive supply voltage
QUICK REFERENCE DATA
SYMBOL
PARAMETER
tPLH Propagation delay
tPHL CPn to Qn or Qn
CIN Input capacitance
ICC Total supply current
CONDITIONS
Tamb = 25°C; GND = 0V
CL = 50pF; VCC = 5V
VI = 0V or VCC
Outputs disabled; VCC =5.5V
TYPICAL
2.8
2.4
3
2
UNIT
ns
pF
µA
ORDERING INFORMATION
PACKAGES
14-pin plastic DIP
14-pin plastic SOL
14-pin plastic shrink small outline SSOP Type II
14-pin plastic thin shrink small outline (TSSOP) Type I
TEMPERATURE RANGE
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
ORDER CODE
74ABT5074N
74ABT5074D
74ABT5074DB
74ABT5074PW
DRAWING NUMBER
SOT27-1
SOT108-1
SOT337-1
SOT402-1
December 15, 1994
1
853-1775 14470









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74ABT5074DB Даташит, Описание, Даташиты
Philips Semiconductors Advanced BiCMOS Products
Synchronizing dual D-type flip-flop
with metastable immune characteristics
Product specification
74ABT5074
LOGIC SYMBOL
2 12
D0 D1
3 CP0
4 SD0
1 RD0
11 CP1
10 SD1
13 RD1
Q0 Q0 Q1 Q1
VCC = Pin 14
GND = Pin 7
56 98
LOGIC DIAGRAM
SD 4, 10
RD 1, 13
CP 3, 11
D 2, 12
VCC = Pin 14
GND = Pin 7
IEC/IEEE SYMBOL
SA00002
4
S
3
C1
2
1D
1
R
10
S
11
C2
12
2D
13
R
5
6
9
8
SA00003
5, 9
Q
6, 8
Q
SF00048
FUNCTION TABLE
INPUTS
SD RD CP
D
OUTPUTS
QQ
OPERATING
MODE
LHXX
H
L Asynchronous set
HLXX
L
H Asynchronous reset
L LXX
L
H Undetermined*
HHh
H
L Load ”1”
HH
l
L
H Load ”0”
H H X NC NC Hold
NOTES:
H = High voltage level
h = High voltage level one setup time prior to low-to-high clock
transition
L = Low voltage level
l = Low voltage level one setup time prior to low-to-high clock
transition
NC= No change from the previous setup
X = Don’t care
= Low-to-high clock transition
= Not low-to-high clock transition
* = This setup is unstable and will change when either set or
reset return to the high level
December 15, 1994
2









No Preview Available !

74ABT5074DB Даташит, Описание, Даташиты
Philips Semiconductors Advanced BiCMOS Products
Synchronizing dual D-type flip-flop
with metastable immune characteristics
Product specification
74ABT5074
METASTABLE IMMUNE CHARACTERISTICS
Philips Semiconductors uses the term ‘metastable immune’ to
describe characteristics of some of the products in its family. By
running two independent signal generators (see Figure 1) at nearly
the same frequency (in this case 10MHz clock and 10.02MHz data)
the device-under-test can often be driven into a metastable state. If
the Q output is then used to trigger a digital scope set to infinite
persistence the Q output will build a waveform. An experiment was
run by continuously operating the devices in the region where
metastability will occur.
SIGNAL
GENERATOR
SIGNAL
GENERATOR
DQ
CP Q
TRIGGER
DIGITAL
SCOPE
INPUT
Figure 1. Test Setup
SA00004
After determining the T0 and τ of the flop, calculating the mean time
between failures (MTBF) is simple. Suppose a designer wants to
use the 74ABT5074 for synchronizing asynchronous data that is
arriving at 10MHz (as measured by a frequency counter), has a
clock frequency of 50MHz, and has decided that he would like to
sample the output of the 74ABT5074 7 nanoseconds after the clock
edge. He simply plugs his number into the following equation:
MTBF = e(t’/τ)/ TO*fC*fI
In this formula, fC is the frequency of the clock, fI is the average
input event frequency, and t’ is the time after the clock pulse that the
output is sampled (t’ > h, h being the normal propagation delay). In
this situation the fI will be twice the data frequency of 20 MHz
because input events consist of both of low and high transitions.
Multiplying fI by fC gives an answer of 1015 Hz2. From Figure 2 it is
clear that the MTBF is greater than 1010 seconds. Using the above
formula the actual MTBF is 1.69 × 1010 seconds or about 535 years.
E13
E6 E8
E10 E12 E14 E15 = fc*fi
E12
10,000 YEARS E11
MTBF
(SECONDS)
E10
100 YEARS E9
E8
ONE YEAR E7
E6
ONE WEEK E5
456
t’ (NANOSECONDS)
VCC = 5V, Tamb = 25°C, τ =94ps, To = 1.3x107 sec MTBF = e(t’/τ)/TO*fC*fI
7
Figure 2. Mean Time Between Failures (MTBF) versus t’
8
SA00005
December 15, 1994
3










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74ABT5074DSynchronizing dual D-type flip-flop with metastable immune characteristicsNXP Semiconductors
NXP Semiconductors
74ABT5074DBSynchronizing dual D-type flip-flop with metastable immune characteristicsNXP Semiconductors
NXP Semiconductors

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