N74F828D Datasheet PDF - Philips
| Part Number | N74F828D | |
| Description | 10-bit buffer/line driver / non-inverting 3-State | |
| Manufacturers | Philips | |
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INTEGRATED CIRCUITS
74F827
10-bit buffer/line driver, non-inverting
(3-State)
74F828
10-bit buffer/line driver, inverting
(3-State)
Product specification
IC15 Data Handbook
1994 Dec 5
Philips Semiconductors
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Philips Semiconductors
Buffers
Product specification
74F827, 74F828
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
UNIT
Min Nom Max
4.5 5.0 5.5 V
2.0 V
0.8 V
–18 mA
–24 mA
64 mA
0 +70 °C
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX UNIT
VOH High-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –15mA
IOH = –24mA
"10%VCC
"5%VCC
"10%VCC
"5%VCC
2.4
2.4 3.3
2.0
2.0
V
V
V
V
VOL Low-level output voltage
VCC = MIN,
VIL = MAX,
VIH = MIN
IOL = MAX
"10%VCC
"5%VCC
0.55
0.42 0.55
V
V
VIK
II
IIH
IIL
IOZH
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off-state output current,
High voltage applied
VCC = MIN, II = IIK
VCC = 0.0V, VI = 7.0V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 0.5V
VCC = MAX, VO = 2.7V
–0.73
–1.2
100
20
–20
50
V
µA
µA
µA
µA
IOZL Off-state output current,
Low voltage applied
VCC = MAX, VO = 0.5V
–50 µA
IOS Short circuit output current3
VCC = MAX
–100
–225 mA
ICCH
50 70 mA
74F827
ICCL
VCC = MAX
70 100 mA
ICC
Supply current
(total)
ICCZ
ICCH
60 90 mA
30 45 mA
74F828
ICCL
VCC = MAX
65 85 mA
ICCZ
55 70 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under operating conditions for the applicable type.
2. All typical values are at VCC = 5V, TA = 25°C.
3. Not more than one output should be shorted at one time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1994 Dec 05
5
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| Information | Total 12 Pages | |
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| Download | [ N74F828D.PDF Datasheet ] | |
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Featured Datasheets
| Part Number | Description | MFRS |
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