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74F32 PDF даташит

Спецификация 74F32 изготовлена ​​​​«Philips» и имеет функцию, называемую «Quad 2-input OR gate».

Детали детали

Номер произв 74F32
Описание Quad 2-input OR gate
Производители Philips
логотип Philips логотип 

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74F32 Даташит, Описание, Даташиты
INTEGRATED CIRCUITS
74F32
Quad 2-input OR gate
Product specification
IC15 Data Handbook
Philips
Semiconductors
1990 Oct 04









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74F32 Даташит, Описание, Даташиты
Philips Semiconductors
Quad 2-input OR gate
Product specification
74F32
FEATURE
Industrial temperature range available (–40°C to +85°C)
TYPE
74F32
TYPICAL
PROPAGATION
DELAY
4.1ns
TYPICAL
SUPPLY CURRENT
(TOTAL)
8.2mA
PIN CONFIGURATION
D0a 1
D0b 2
Q0 3
D1a 4
D1b 5
Q1 6
GND 7
14 VCC
13 D3b
12 D3a
11 Q3
10 D2b
9 D2a
8 Q2
SF00038
ORDERING INFORMATION
DESCRIPTION
14-pin plastic DIP
ORDER CODE
COMMERCIAL RANGE
VCC = 5V ±10%, Tamb = 0°C to +70°C
N74F32N
INDUSTRIAL RANGE
VCC = 5V ±10%, Tamb = –40°C to +85°C
I74F32N
14-pin plastic SO
N74F32D
I74F32D
PKG DWG #
SOT27-1
SOT108–1
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS
DESCRIPTION
74F (U.L.) HIGH/LOW
Dna, Dnb
Data inputs
1.0/1.0
Qn Data output
50/33
NOTE: One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.
LOAD VALUE HIGH/LOW
20µA/0.6mA
1.0mA/20mA
LOGIC DIAGRAM
D0a 1
D0b 2
D1a 4
D1b 5
VCC = Pin 14
GND = Pin 7
D2a 9
D2b 10
12
D3a
D3b 13
3
Q0
6
Q1
8
Q2
11
Q3
SF00039
FUNCTION TABLE
INPUTS
Dna Dnb
LL
LH
HL
HH
NOTES:
1 H = High voltage level
2 L = Low voltage level
OUTPUT
Qn
L
H
H
H
LOGIC SYMBOL
1 2 4 5 9 10 12 13
IEC/IEEE SYMBOL
1
2
1
3
VCC = Pin 14
GND = Pin 7
D0a D0bD1a D1bD2a D2b D3a D3b
Q0 Q1 Q2 Q3
3 6 8 11
SF00040
4
6
5
9
8
10
12
11
13
SF00041
October 4, 1990
2 853 0333 00624









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74F32 Даташит, Описание, Даташиты
Philips Semiconductors
Quad 2-input OR gate
Product specification
74F32
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
PARAMETER
VCC Supply voltage
VIN
IIN
VOUT
IOUT
Tamb
Input voltage
Input current
Voltage applied to output in high output state
Current applied to output in low output state
Operating free air temperature range
Commercial range
Industrial range
Tstg Storage temperature range
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIk
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free air temperature range
MIN
4.5
2.0
Commercial range
Industrial range
0
–40
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to VCC
40
0 to +70
–40 to +85
–65 to +150
LIMITS
NOM
5.0
MAX
5.5
0.8
–18
–1
20
+70
+85
UNIT
V
V
mA
V
mA
°C
°C
°C
UNIT
V
V
V
mA
mA
mA
°C
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
MIN
TYP2
MAX
VOH High-level output voltage
VCC = MIN, VIL = MAX ±10%VCC
2.5
VIH = MIN, IOH = MAX ±5%VCC
2.7
VOL Low-level output voltage
VCC = MIN, VIL = MAX ±10%VCC
VIH = MIN, IOl = MAX
±5%VCC
VIK Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input
voltage
VCC = MAX, VI = 7.0V
3.4
0.30
0.30
-0.73
0.50
0.50
-1.2
100
V
V
V
V
V
µA
IIH High-level input current
VCC = MAX, VI = 2.7V
20 µA
IIL Low-level input current
VCC = MAX, VI = 0.5V
-0.6 mA
IOS
Short-circuit output current3
VCC = MAX
-60
-150
mA
ICC
Supply current (total)
ICCH VCC = MAX
VIN = 4.5V
6.1 9.2 mA
ICCL VCC = MAX
VIN = GND
10.3 15.5
mA
NOTES:
1 For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2 All typical values are at VCC = 5V, Tamb = 25°C.
3 Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
October 4, 1990
3










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