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CCD134 PDF даташит

Спецификация CCD134 изготовлена ​​​​«Fairchild Imaging» и имеет функцию, называемую «1024 Element Linear Image Sensor».

Детали детали

Номер произв CCD134
Описание 1024 Element Linear Image Sensor
Производители Fairchild Imaging
логотип Fairchild Imaging логотип 

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CCD134 Даташит, Описание, Даташиты
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CCD 134
1024-Element
Linear Image Sensor
FEATURES
1024 x 1 photosite array
13 µm x 13 µm photosites on 13µm pitch
Anti-blooming and integration control
Enhanced spectral response (particularly in the
blue region)
Improved low-light performance over CCD133A
Low dark signal
High responsivity
High-speed operation
On-chip clock drivers
Dynamic range typical: 7500:1
Over 1V peak -to-peak outputs
Dark and white references contained in sample-
and -held outputs
Special selections available —consult factory
GENERAL DESCRIPTION
The CCD134
designed for
is a 1024-element line
industrial measurement,
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document scanning applications which require high
resolution, high sensitivity and high data rate. The in-
corporation of on-chip antiblooming and integration
control allow the CCD134 to be extremely useful in an
industrial measurement and control environment or en-
vironments where lighting conditions are difficult to
control.
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Fairchild Imaging, Inc., 1801 McCarthy Blvd., Milpitas, CA 95035 • (800)325-6975 • (408) 433-2500
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CCD134 Даташит, Описание, Даташиты
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CCD134
Fig. 1 BLOCK DIAGRAM
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The CCD134 is similar to the CCD133A except for the additional
two registers serve to reduce peripheral electron noise in the inner
features of anti-blooming and integration control. The CCD134 is a
shift registers.
third generation device having an overall improved performance
compared with first and second generation devices, including en-
Two Gated Charge Detector/Amplifiers — Charge packets
hanced blue response and excellent low light level performance.
are transported to a precharged capacitor whose potential changes
The device incorporates on-chip clock driver circuitry and is capable
linearly in response to the quantity of the signal charge delivered.
of high-speed operation up to a 20MHz data rate. The photoelement
This potential is applied to the input gate of the two-stage NMOS
size is 13µm (0.51 mils) x 13µm (0.51 mils) on 13µm (0.51 mils)
amplifiers producing a signal at the output “Vout pins. The sample-
centers. The device is manufactured using Fairchild WestoDnaatad-Sheet4Uan.cdo-hmold gate is a switching MOS transistor in the output amplifier
vanced charge-coupled device n-channel isoplanar buried-channel
that allows the output to be delivered as a sample-and held wave-
technology.
form. The diode is recharged internally before the arrival of each new
FUNCTIONAL DESCRIPTION
signal charge-packet from the transport shift register.
The CCD134 consists of the following functional elements illustrated
in the Block Diagram and Circuit Diagram (Fig1.).
Integration and Anti-Blooming Control — In many applica-
tions the dynamic range in parts of the image is larger than the dy-
Photosites — A row of 1024 image sensor elements separated
by a diffused channel stop and covered by a silicon dioxide surface
passivation layer. Image photons pass through the transparent sili-
con creating hole-electron pairs. The photon generated electrons
are accumulated in the photosites. The amount of charge accumu-
lated in each photosite is a linear function of the incident illumination
intensity and the integration period. The output signal will vary in an
namic range of the CCD, which may cause more electrons to be
generated in the photosite area than can be stored in the CCD shift
register. This is particularly common in industrial inspection and sat-
ellite applications. The excess electrons generated by bright illumi-
nation tend to “bloom” or “spill over” to neighboring pixels along the
shift register, thus “smearing” the information. This smearing can be
eliminated using two methods:
analog manner from a thermally generated background level at zero
illumination to a maximum at saturation under bright illumination.
Anti-Blooming Operation:
Transfer Gates — This gate is a structure adjacent to the row of
image sensor elements. The charge packets accumulated in the
photosites are transferred in parallel via the transfer gate to the trans-
port shift registers whenever the transfer gate voltage goes high.
Alternate charge packets are transferred to the A and B transport
registers.
A DC voltage applied to the integration control gate (approximately 5
to 7 volts) will cause excess charge generated in the photosites to be
diverted to the anti-blooming sink (VSINK) instead of the shift regis-
ters. This acts as a “clipping circuit” for the CCD output (see Fig. 2)
Integration Control Operation:
Four 529 Bit Analog Transport Shift Registers — Two reg-
isters are on each side of the line of image sensor elements and are
separated from it by the transfer gate. The two inside registers,
called the transport shift registers are used to move the light gener-
ated charge packets delivered by the transfer gates serially to the
charge detector amplifier. The complementary phase relationship
of the last elements of the two transport registers provides for alter-
nate delivery of charge packets at the output amplifiers. The outer
Variable integration times which are less than the CCD exposure time
may be attained by supplying a clock to the integration control gate.
Clocking φIC reduces the photosite signal in all photosites by the ra-
tion tEXPOSURE/tINT. Greater than 10:1 reduction in the average
photosite signal can be achieved with integration control.
The integration-control and anti-blooming features can be imple-
mented simultaneously. This is done by setting the φIC clock-low
level to approximately 5 to 7 volts.
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Fairchild Imaging, Inc., 1801 McCarthy Blvd., Milpitas, CA 95035 • (800)325-6975 • (408) 433-2500
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CCD134
Fig. 2 INTEGRATION-CONTROL TIMING DIAGRAM AND NOTES
Fig. 3 TEST LOAD CONFIGURATION (INTERNAL SAMPLE-AND-HOLD ENABLED)
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Fig. 4 TEST LOAD CONFIGURATION
(INTERNAL SAMPLE-AND-HOLD DISABLED)
Fig. 5 MAXIMUM OUTPUT VOLTAGE vs. φIC VOLTAGE
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Fairchild Imaging, Inc., 1801 McCarthy Blvd., Milpitas, CA 95035 • (800)325-6975 • (408) 433-2500
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Номер в каталогеОписаниеПроизводители
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CCD1341024 Element Linear Image SensorFairchild Imaging
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