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PDF HMD8M32M4G Data sheet ( Hoja de datos )

Número de pieza HMD8M32M4G
Descripción 32Mbyte(8Mx32) 72-pin SIMM
Fabricantes Hanbit Electronics 
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HANBit
HMD8M32M4G
32Mbyte(8Mx32) 72-pin SIMM, FP Mode, 4K Ref. 5V
Part No. HMD8M32M4, HMD8M32M4G
GENERAL DESCRIPTION
The HMD8M32M4 is a 8M x 32bit dynamic RAM high density memory module. The module consists of four CMOS 4M x
16 bit DRAMs in 50-pin TSOP packages mounted on a 72-pin, double-sided, FR-4-printed circuit board. A 0.1uF or 0.22uF
decoupling capacitor is mounted on the printed circuit board for each DRAM components.
The module is a single In-line memory module with edge connections and is intended for mounting in to 72-pin edge
connector sockets. All module components may be powered from a single 5V DC power supply and all inputs and outputs
are TTL-compatible.
FEATURES
www.DataShwePeta4rUt I.cdeonmtification
HMD8M32M4----4K Cycles/64ms Ref, Solder
HMD8M32M4G- 4K Cycles/64ms Ref, Gold
w Access times : 50, 60ns
w High-density 32MByte design
w Single +5V ±0.5V power supply
w JEDEC Standard pinout
w Fast Page mode operation
w TTL compatible inputs and outputs
w FR4-PCB design
OPTIONS
w Timing
50ns access
60ns access
MARKING
-5
-6
w Packages
72-pin SIMM
M
PRESENCE DETECT PINS
Pin 50ns
PD1
NC
PD2
Vss
PD3
Vss
PD4
Vss
PERFORMANCE RANGE
Speed
tRAC
tCAC
5
50ns
13ns
6
60ns
15ns
60ns
NC
Vss
NC
NC
tRC
90ns
110ns
PIN ASSIGNMENT
PIN SYMBOL PIN SYMBOL PIN SYMBOL
1 Vss 25 DQ22 49 DQ8
2
DQ0
26
DQ7
50 DQ24
3 DQ16 27 DQ23 51
DQ9
4
DQ1
28
A7
52 DQ25
5 DQ17 29 A11 53 DQ10
6
DQ2
30
Vcc
54 DQ26
7 DQ18 31 A8 55 DQ11
8
DQ3
32
A9
56 DQ27
9 DQ19 33 NC 57 DQ12
10 Vcc 34 NC 58 DQ28
11 NC 35 NC 59 Vcc
12 A0 36 NC 60 DQ29
13 A1 37 NC 61 DQ13
14 A2 38 NC 62 DQ30
15 A3 39 Vss 63 DQ14
16 A4 40 /CAS0 64 DQ31
17 A5 41 /CAS2 65 DQ15
18 A6 42 /CAS3 66 NC
19 A10 43 /CAS1 67 PD1
20 DQ4 44 /RAS0 68
PD2
21 DQ20 45 /RAS1 69
PD3
22 DQ5 46 NC 70 PD4
23 DQ21 47 /WE 71 NC
24 DQ6 48 NC 72 Vss
URL:www.hbe.co.kr
REV.1.0 (August.2002)
-1-
HANBit Electronics Co.,Ltd.

1 page




HMD8M32M4G pdf
HANBit
HMD8M32M4G
Column address set-up time
tASC
0
0
ns
Column address hold time
tCAH
10
10
ns
Column Address to /RAS lead time
tRAL 25
30
ns
Read command set-up time
tRCS
0
0
ns
Read command hold referenced to /CAS
tRCH
0
0
ns
Read command hold referenced to /RAS
tRRH
0
0
ns
Write command hold time
tWCH
10
10
ns
Write command pulse width
tWP 10
10
ns
Write command to /RAS lead time
tRWL
15
15
ns
Write command to /CAS lead time
www.DataSheDeat4taU-.icnosmet-up time
tCWL
tDS
13
0
15
0
ns
ns
Data-in hold time
tDH 10
15
ns
Refresh period
tREF 64
64 ns
Write command set-up time
tWCS
0
0
ns
/CAS setup time (C-B-R refresh)
tCSR
5
5
ns
/CAS hold time (C-B-R refresh)
tCHR
10
10
ns
/RAS precharge to /CAS hold time
tRPC
5
5
ns
Access time from /CAS precharge
tCPA
30
35 ns
Fast page mode cycle time
tPC 35
45
ns
/CAS precharge time (Fast page)
tCP 10
10
ns
/RAS pulse width (Fast page )
tRASP
50
200K
60
200K
ns
/W to /RAS precharge time (C-B-R refresh)
tWRP
10
10
ns
/W to /RAS hold time (C-B-R refresh)
tWRH
10
10
ns
/CAS precharge(C-B-R counter test)
tCPT 20
30
ns
NOTES
1.An initial pause of 200µs is required after power-up followed by any 8 /RAS-only or /CAS-before-/RAS refresh cycles
before proper device operation is achieved.
2.VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Transition times are measured between
VIH(min) and VIL(max) and are assumed to be 5ns for all inputs.
3.Measured with a load equivalent to 1TTL loads and 100pF
4.Operation within the tRCD(max) limit insures that tRAC(max) can be met. tRCD(max) is specified as a reference point only. If tRCD
is greater than the specified tRCD(max) limit, then access time is controlled exclusively by tCAC.
5.Assumes that tRCD tRCD(max)
6. tAR, tWCR, tDHR are referenced to tRAD(max)
7.This parameter defines the time at which the output achieves the open circuit condition and is not referenced to VOH
or VOL.
8. tWCS, tRWD, tCWD and tAWD are non restrictive operating parameter.
They are included in the data sheet as electrical characteristic only. If tWCS tWCS(min) the cycle is an early write
cycle and the data out pin will remain high impedance for the duration of the cycle.
9. Either tRCH or tRRH must be satisfied for a read cycle.
10. These parameters are referenced to the /CAS leading edge in early write cycles and to the /W leading edge in read-
write cycles.
11. Operation within the tRAD(max) limit insures that tRAC(max) can be met. tRAD(max) is specified as a reference
point only. If tRAD is greater than the specified tRAD(max) limit. then access time is controlled by tAA.
URL:www.hbe.co.kr
REV.1.0 (August.2002)
-5-
HANBit Electronics Co.,Ltd.

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