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Número de pieza HCTS157HMSR
Descripción Radiation Hardened Quad 2-Input Multiplexers
Fabricantes Intersil Corporation　
Logotipo Intersil Corporation Logotipo



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HCTS157MS
August 1995
Radiation Hardened
Quad 2-Input Multiplexers
Features
Pinouts
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
- Standard Outputs 10 LSTTL Loads
• Military Temperature Range: -55oC to +125oC
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16
TOP VIEW
S1
1I0 2
1I1 3
1Y 4
2I0 5
2I1 6
2Y 7
GND 8
16 VCC
15 E
14 4I0
13 4I1
12 4Y
11 3I0
10 3I1
9 3Y
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCTS157MS is a Radiation Hardened quad
2-input multiplexers with select and enable inputs.
The HCTS157MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
S
1I0
1I1
1Y
2I0
2I1
2Y
GND
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F16
TOP VIEW
1 16
2 15
3 14
4 13
5 12
6 11
7 10
89
The HCTS157MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
VCC
E
4I0
4I1
4Y
3I0
3I1
3Y
Ordering Information
PART NUMBER
HCTS157DMSR
HCTS157KMSR
HCTS157D/Sample
HCTS157K/Sample
HCTS157HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
550
Spec Number 518610
File Number 2464.2

1 page




HCTS157HMSR pdf
Specifications HCTS157MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Quiescent Current
Output Current (Sink)
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage Current
Noise Immunity
Functional Test
Data to Output
Enable to Output
Select to Output
SYMBOL
(NOTES 1, 2)
CONDITIONS
ICC VCC = 5.5V, VIN = VCC or GND
IOL VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
IOH VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
VOL VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.8V, IOL = 50µA
VOH
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.8V, IOH = -50µA
IIN VCC = 5.5V, VIN = VCC or GND
FN VCC = 4.5V, VIH = 2.25V, VIL = 0.8V,
(Note 3)
TPHL VCC = 4.5V
TPLH VCC = 4.5V
TPHL VCC = 4.5V
TPLH VCC = 4.5V
TPHL VCC = 4.5V
TPLH VCC = 4.5V
TEMPERATURE
+25oC
+25oC
200K RAD
LIMITS
MIN MAX UNITS
- 0.75 mA
6.0 - mA
+25oC
-6.0 - mA
+25oC
- 0.1 V
+25oC
+25oC
+25oC
VCC
-0.1
-
-
-
±5
-
V
µA
-
+25oC
+25oC
+25oC
+25oC
+25oC
+25oC
2 30 ns
2 24 ns
2 25 ns
2 25 ns
2 37 ns
2 29 ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC 5 12µA
IOL/IOH
5 -15% of 0 Hour
Spec Number 518610
554

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