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PDF HCTS393K Data sheet ( Hoja de datos )

Número de pieza HCTS393K
Descripción Radiation Hardened Dual 4-Stage Binary Counter
Fabricantes Intersil Corporation　
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No Preview Available ! HCTS393K Hoja de datos, Descripción, Manual

HCTS390MS
September 1995
Radiation Hardened
Dual Decade Ripple Counter
Features
Pinouts
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm2/mg
• Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/
Bit-Day (Typ)
• Dose Rate Survivability: >1 x 1012 RAD (Si)/s
• Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55oC to +125oC
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = 2.0V Min
• Input Current Levels Ii ≤ 5µA at VOL, VOH
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16
TOP VIEW
CP0N 1 1
MR 1 2
Q0 1 3
CP1N 1 4
Q1 1 5
Q2 1 6
Q3 1 7
GND 8
16 VCC
15 CP0N 2
14 MR 2
13 Q0 2
12 CP1N 2
11 Q1 2
10 Q2 2
9 Q3 2
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F16
TOP VIEW
Description
The Intersil HCTS390MS is a Radiation Hardened dual
decade ripple counter.
The HCTS390MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family .
The HCTS390MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
CP0N 1
MR 1
Q0 1
CP1N 1
Q1 1
Q2 1
Q3 1
GND
1 16
2 15
3 14
4 13
5 12
6 11
7 10
89
VCC
CP0N 2
MR 2
Q0 2
CP1N 2
Q1 2
Q2 2
Q3 2
Ordering Information
PART NUMBER
HCTS390DMSR
HCTS390KMSR
HCTS390D/Sample
HCTS390K/Sample
HCTS390HMSR
TEMPERATURE RANGE
-55oC to +125oC
-55oC to +125oC
+25oC
+25oC
+25oC
SCREENING LEVEL
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
PACKAGE
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
662
Spec Number 518634
File Number 2476.2

1 page




HCTS393K pdf
Specifications HCTS390MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Quiescent Current
Output Current (Sink)
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage Current
Noise Immunity
Functional Test
CP0Nn to Q0n
CP1Nn to Q1n
CP1Nn to Q2n
CP1Nn to Q3n
MR to Qn
SYMBOL
(NOTES 1, 2)
CONDITIONS
ICC VCC = 5.5V, VIN = VCC or GND
IOL VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
IOH VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
VOL
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.80V, IOL = 50µA
VOH
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.80V, IOL = -50µA
IIN VCC = 5.5V, VIN = VCC or GND
FN VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
(Note 3)
TPHL
TPLH
VCC = 4.5V
TPHL
TPLH
VCC = 4.5V
TPHL
TPLH
VCC = 4.5V
TPHL
TPLH
VCC = 4.5V
TPHL VCC = 4.5V
TEMPERATURE
+25oC
+25oC
200K RAD
LIMITS
MIN MAX UNITS
- 0.75 mA
4.0 - mA
+25oC
-4.0 - mA
+25oC
- 0.1 V
+25oC
+25oC
+25oC
VCC
-0.1
-
-
-
±5
-
V
µA
-
+25oC
2 27 ns
+25oC
2 35 ns
+25oC
2 41 ns
+25oC
2 35 ns
+25oC
2 29 ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC 5 12µA
IOL/IOH
5 -15% of 0 Hour
Spec Number 518634
666

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