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CGHV27100 PDF даташит

Спецификация CGHV27100 изготовлена ​​​​«Cree» и имеет функцию, называемую «GaN HEMT».

Детали детали

Номер произв CGHV27100
Описание GaN HEMT
Производители Cree
логотип Cree логотип 

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CGHV27100 Даташит, Описание, Даташиты
CGHV27100
100 W, 2500-2700 MHz, 50 V, GaN HEMT for LTE
Cree’s CGHV27100 is a gallium nitride (GaN) high electron mobility transistor (HEMT)
is designed specifically for high efficiency, high gain and wide bandwidth capabilities,
which makes the CGHV27100 ideal for 2.5 - 2.7 GHz LTE, 4G Telecom and BWA
amplifier applications. The transistor is input matched and supplied in a ceramic/
metal pill and flange packages.
PNPa: CckGaHgVe2T7y1p0e0: F44a0n1d6C2GaHndV2474100106P1
Typical Performance Over 2.5 - 2.7 GHz (TC = 25˚C) of Demonstration Amplifier
Parameter
2.5 GHz
2.6 GHz
2.7 GHz
Gain @ 44 dBm
18.1
18.0
17.9
ACLR @ 44 dBm
-37.0
-37.0
-37.0
Drain Efficiency @ 44 dBm
34.0
33.5
32.0
Note:
Measured in the CGHV27100-AMP amplifier circuit, under WCDMA 3GPP test model 1, 64 DPCH, 45% clipping,
PAR = 7.5 dB @ 0.01% Probability on CCDF, VDD = 50 V, IDS = 500 mA.
Units
dB
dBc
%
Features
• 2.5 - 2.7 GHz Operation
• 18.0 dB Gain
• -37 dBc ACLR at 25 W PAVE
• 33 % Efficiency at 25 W PAVE
• High Degree of DPD Correction Can be Applied
Subject to change without notice.
www.cree.com/rf
1









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CGHV27100 Даташит, Описание, Даташиты
Absolute Maximum Ratings (not simultaneous) at 25˚C Case Temperature
Parameter
Symbol
Drain-Source Voltage
Gate-to-Source Voltage
Storage Temperature
Operating Junction Temperature
Maximum Forward Gate Current
Maximum Drain Current1
Soldering Temperature2
Screw Torque
VDSS
VGS
TSTG
TJ
IGMAX
IDMAX
TS
τ
Thermal Resistance, Junction to Case3
Thermal Resistance, Junction to Case4
Case Operating Temperature5
RθJC
RθJC
TC
Note:
1 Current limit for long term, reliable operation.
2 Refer to the Application Note on soldering at http://www.cree.com/rf/document-library
3 Measured for the CGHV27100P
4 Measured for the CGHV27100F
5 See also, the Power Dissipation De-rating Curve on Page 5.
Electrical Characteristics (TC = 25˚C)
Rating
125
-10, +2
-65, +150
225
16
6
245
80
2.34
2.95
-40, +150
Units
Volts
Volts
˚C
˚C
mA
A
˚C
in-oz
˚C/W
˚C/W
˚C
Conditions
25˚C
25˚C
25˚C
25˚C
85˚C, PDISS = 48 W
85˚C, PDISS = 48 W
Characteristics
DC Characteristics1
Symbol
Min.
Typ.
Max.
Units
Conditions
Gate Threshold Voltage
VGS(th)
-3.8
Gate Quiescent Voltage
VGS(Q)
Saturated Drain Current2
IDS 12
Drain-Source Breakdown Voltage
VBR 150
RF Characteristics5 (TC = 25˚C, F0 = 2.7 GHz unless otherwise noted)
Saturated Output Power3,4
PSAT
-3.0
-2.7
14.4
135
-2.3
VDC VDS = 10 V, ID = 16 mA
VDC VDS = 50 V, ID = 500 mA
A VDS = 6.0 V, VGS = 2.0 V
VDC VGS = -8 V, ID = 16 mA
W VDD = 50 V, IDQ = 500 mA
Pulsed Drain Efficiency3,4
η 68 % VDD = 50 V, IDQ = 500 mA, POUT = PSAT
Gain6
G – 18 – dB VDD = 50 V, IDQ = 500 mA, POUT = 44 dBm
WCDMA Linearity6
ACLR
-37
dBc VDD = 50 V, IDQ = 500 mA, POUT = 44 dBm
Drain Efficiency6
Output Mismatch Stress3
Dynamic Characteristics
η
VSWR
33
% VDD = 50 V, IDQ = 500 mA, POUT = 44 dBm
10 : 1 Y No damage at all phase angles, VDD = 50 V, IDQ =
500 mA, POUT = 100 W Pulsed
Input Capacitance7
CGS 66 pF VDS = 50 V, Vgs = -8 V, f = 1 MHz
Output Capacitance7
CDS 8.7 pF VDS = 50 V, Vgs = -8 V, f = 1 MHz
Feedback Capacitance
CGD 0.47 pF VDS = 50 V, Vgs = -8 V, f = 1 MHz
Notes:
1 Measured on wafer prior to packaging.
2 Scaled from PCM data.
3 Pulse Width = 100 µs, Duty Cycle = 10%
4 PSAT is defined as IGS = 1.6 mA peak
5 Measured in CGHV27100-AMP
6 Single Carrier WCDMA, 3GPP Test Model 1, 64 DPCH, 45% Clipping, PAR = 7.5 dB @ 0.01% Probability on CCDF, VDD = 50 V.
7 Includes package and internal matching components.
Copyright © 2014-2015 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree and the Cree logo are
registered trademarks of Cree, Inc.
2 CGHV27100 Rev 1.0
Cree, Inc.
4600 Silicon Drive
Durham, North Carolina, USA 27703
USA Tel: +1.919.313.5300
Fax: +1.919.869.2733
www.cree.com/rf









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CGHV27100 Даташит, Описание, Даташиты
Typical Performance
Figure 1. - Small Signal Gain and Return Losses vs Frequency for the
CGHV27100 measured in CGHV27100-AMP Amplifier Circuit
VDD = 50 V, IDQ = 0.5 A
25
20
15
10
5
0
-5
-10
-15 S11
S21
S22
-20
2.0 2.1 2.2 2.3 2.4 2.5 2.6 2.7 2.8 2.9 3.0
Frequency (GHz)
Typical Linear Performance
Figure 2. - Typical Gain, Drain Efficiency and ACLR vs Output Power
of the CGHV27100 measured in CGHV27100-AMP Amplifier Circuit
VDS = 50 V, IDS = 0.5 A, 1c WCDMA, PAR = 7.5 dB
0
50
-5
2.5GHz ACPR
2.6GHz ACPR
-10 2.7GHz ACPR
2.5GHz Drain Efficiency
2.6GHz Drain Efficiency
-15 2.7GHz Drain Efficiency
2.5GHz Gain
2.6GHz Gain
-20 2.7GHz Gain
45
40
35
30
-25 25
-30 20
-35 15
-40 10
-45 5
-50 0
28 30 32 34 36 38 40 42 44 46 48
Output Power (dBm)
Copyright © 2014-2015 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree and the Cree logo are
registered trademarks of Cree, Inc.
3 CGHV27100 Rev 1.0
Cree, Inc.
4600 Silicon Drive
Durham, North Carolina, USA 27703
USA Tel: +1.919.313.5300
Fax: +1.919.869.2733
www.cree.com/rf










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